2024-03-29T11:25:08Z
https://oai.zbmath.org/v1/
oai:zbmath.org:7442841
2021-12-13T14:52:06Z
62
Liu, Di; Wang, Shaoping; Zhang, Chao
2022
7442841
English
Elsevier (North-Holland), New York, NY
https://zbmath.org/07442841
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Appl. Math. Comput. 417, Article ID 126757, 17 p. (2022).
62N05; 62F15; 62M45
Reliability estimation from two types of accelerated testing data based on an artificial neural network supported Wiener process
j