2024-03-28T08:22:55Z
https://oai.zbmath.org/v1/
oai:zbmath.org:7341761
2021-05-03T11:57:17Z
46
60
Chaumont, Loïc; Małecki, Jacek
2020
7341761
English
Springer Netherlands, Dordrecht
https://zbmath.org/07341761
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Acta Appl. Math. 169, 59-77 (2020).
60G51; 60G52; 46N30
The entrance law of the excursion measure of the reflected process for some classes of Lévy processes
j