2024-03-29T01:53:33Z
https://oai.zbmath.org/v1/
oai:zbmath.org:6062646
2012-07-31T16:32:54Z
62
68
Dembczyński, Krzysztof; Waegeman, Willem; Cheng, Weiwei; Hüllermeier, Eyke
2012
6062646
English
Springer US, New York, NY
https://zbmath.org/06062646
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Mach. Learn. 88, No. 1-2, 5-45 (2012).
68T05; 62H30
On label dependence and loss minimization in multi-label classification
j