2024-03-29T00:50:47Z
https://oai.zbmath.org/v1/
oai:zbmath.org:5780331
2010-09-07T10:56:00Z
74
Bhandakkar, Tanmay K.; Gao, Huajian
2010
5780331
English
Elsevier, Amsterdam
https://zbmath.org/05780331
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Int. J. Solids Struct. 47, No. 10, 1424-1434 (2010).
74R99; 74E40; 74F15
Cohesive modeling of crack nucleation under diffusion-induced stresses in a thin strip: implications on the critical size for flaw tolerant battery electrodes
j